Backbit Chip Tester Pro

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Backbit Chip Tester Pro

I contacted Evie the creator of this Backbit Chip Tester Pro and asked her: if she can add support for the Signetics 2504, 2513 and 2519 and also for the DS0025.

She is positive that this is possible.

https://store.backbit.io/product-category/tester/

Ther ist already an adaptor for 4116 RAMs https://store.backbit.io/product/4116dramadapter/

That could provide the needed voltages for the chips in question.

Would someone preferably from the USA support this and lend her working samples of the mentioned chips?

I hear you asking: Why I don't send her samples? Two reasons first I don't have an Apple I nor the chips and second I'm from Europe.

 

The Chip Tester can already test all the other chips used in the Apple I.

 

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On testing Signetics 2504, 2513, 2519 and NSC DS0025

In post #1, 'natas666' wrote:

 

 ".... add support for the Signetics 2504, 2513 and 2519 and also for the DS0025. She is positive that this is possible."

 

Uncle Bernie comments:

 

If that "Backbit" chip tester can work with PMOS logic levels from +5V to -12V on its own inputs such that

 

a) it can verify the logic swing to -12V in programmable steps

b) it does not blow up itself

 

then indeed it could be possible ... note that the tester also must be able to provide +5V/-12V clocks.

 

So tell me more about your plan how this can be accomplished. I might be able to help as I live in the USA and I do have a  few good and a few bad specimen of these ICs left over. But I do not want to waste them on a futile exercise that only costs time and money and fails to accomplish its goals.

 

Not implying that 'Evie' is incompetent, no, as it seems to be a nice tester, but testing these old PMOS ICs can be very, very tricky. For instance, the 2504 shift registers are notorious for being bit pattern sensitive ... this means they work fine for most bit patterns shifted through them, but fail for certain other patterns (bit cell crosstalk being a factor) but this is anecdotal lore from the early days (late 1960s / early 1970s) of these long obsolete PMOS ICs which were the first 'pipe cleaners' various semiconductor companies employed to debug their brand new first PMOS processes which just were brought online at this time. Most of the engineers who knew more about these patterns were maybe in their 30s back then and now are in their 80s and how to to find and contact them, even if they are not demented yet to a point they know nothing anymore.

 

Note that  it is infeasable to run a humble 1024 bit shift register through all possible bit patterns.  A quick calculation shows that at 1 Mhz clocks  it would take 32.34 x 10^302 years - there is no word for this mind boggling number which has 304 digits. The Universe, as we know it, is only 13.8 x 10 ^ 9 years old  (11 digits). So, "brute force" or "random" patterns won't cut it. The test patterns must be designed knowing how the crosstalk happens. And this knowledge has been lost in time.  This also may be the reason why the problem has not been discovered before these ICs were released onto the market more than half a century ago.

 

But, if all you seek is a simple go/nogo test which does not lay claim to detect the manifestation of the crosstalk issue, then it may be possible to design the required test adapter and the driving software in a useful amount of time ... but this leaves the question whether  it's worth it:

 

How many of these adapters could you sell ? 10 ? 20 ?  - - -  to me it looks like a waste of time, as every Apple-1 builder can plug these ICs right into his build and see if they do work. The symptoms of bad 2504, 2513, 2519 are readily visible on the monitor or TV screen. And a bad (or counterfeit) DS0025 often just makes the 2504 run hot and die. Testable with the fingers, if you don't have an oscilloscope to test the two clock phases before any 2504 are put into their sockets (which I greatly recommend for builders not using my kits of 100% burned-in and known good ICs (sold out since years)).

 

Just playing the Devil's Advocate here. As much as I'd like to offer my help, the question to be answered first is whether the whole mission is worth doing. It may be a colossal waste of time and loss of money.

 

- Uncle Bernie

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Adapter Design

So far the tester can't do that without adapters.

I agree that an Apple I is an excellent tester for this devices but with one limitation, that the Apple 1 needs to have proven working at least one time before.

We have quite some cases in the near past where people did not get there Apple I working, very likely because of bad or faked chips, in addition these people are not able to diagnose properly as they have no clue how to operate an oscilloscope or logic anylyzer. 

I know how you stand to these people that did not buy fully tested and burned in set of parts from you or an other reliable source of Apple 1 kits.

I am fully aware that the tester cannot test any chip good to factory specs, but it can likely detect a large amount of none working or fake chips.

A passed test would basically only say the chip is generally working with a high likelyhood it will also work in circuit.

There are Adapters for 2708 EPROMs and 4116 DRAM.

So I was thinking about something like this for the 2504:

For this will not allow to quallify a Chip as in spec but it can show if the chip is working at all, if it's a 1024-Bit type and if it can be filed with 1s, 0s and a 01-pattern.https://github.com/renatasdgt/1024bit-shift-register-ic-tester/blob/main/schematic/tester_schema.jpg?raw=true

To cover the the DS0025 my idea was very simple if you have verified the 2504 is working jumper 4 Jumpers to disable the replacement circuit and enable the optional DS0025:@p-lab hope it's okay to borrow the schematics from you!Instead of the Arduino Nano there would be a pinheader that connects to the ZIP socket of the BackBit Tester.

For the 2519 the same voltage generator can be used, if I see that correct all outputs need to be pulled down with 7,5kOhm and can directly be connected to a TTL device.@UncleBernie would not it be better to pull the outputs to GND? that would prevent a negative voltage on the TTL device connected to the 2519.

For a 2513 2716 adapter @P-LAB also create something:

As the adapter is intended to be used to replace the 2513 with a 2716 some little modifications would be needed:Instead of a pinheader a socket would be used on the left and a pinheader on the right.If its a Signetics 2513 CM2140 VDD -5V need to be connected to pin 12 and VGG -12V to pin 1 of U2, the GI RO-3-2513 GCR-001 5V only Version does not need the extra voltages.

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Some insights in the difficulty level of building Apple-1 clones

In post #3, 'natas666' wrote:

 

" We have quite some cases in the near past where people did not get their Apple I working, very likely because of bad or faked chips, in addition these people are not able to diagnose properly as they have no clue how to operate an oscilloscope or logic analyzer. "

 

Uncle Bernie comments:

 

Hobbyists who  "have no clue how to operate an oscilloscope"  are well advised to stay away from building Apple-1 clones, except when using 100% tested and burned-in IC kits. My general take on this topic is that attempting to build any complex electronics project without having proper lab instrumentation is the same as "flying blind", which, in aircraft, and with no instruments, or inop instruments, or no IFR qualification, is deady (aka suicidal). In the case of futile attempts to build an Apple-1 this does not mean death of the builder but the financial loss of close to US$1000 in wasted components and a huge hit to the self esteem. So, don't do it if you lack the skills or the instruments. The skills can be learned and the instruments can be bought but this will take time and experience gained with building less complex projects, until you are ready to build an Apple-1. Which is one of the most difficult projects an electronics hobbyist can dare to do.

 

'natas666' also wrote:

 

" I know how you stand to these people that did not buy fully tested and burned in set of parts from you or an other reliable source of Apple 1 kits."

 

Uncle Bernie comments:

 

Oh, I actually admire these "Maverick" Apple-1 builders for their boldness daring to source the ICs helterskelter from dubious sources here, there and everywhere ... especially if Chinese counterfeiters are the "source". And if you have followed their whining here on on Applefritter about their difficulties making their Apple-1 work, you might have noticed I gave them some hints, and some of these mishappen Apple-1 then eventually did work - after a lot of debugging time was spent.

 

Here is a little "confession": it took me several weeks to make my first Apple-1 build work, and I am a retired professional IC designer with more than 50 years of experience in designing and debugging digital and analog electronics, and I have a very well equipped lab with various oscilloscopes, logic analyzers etc.

 

But after my initial "success" yielding only a wonky machine which did crash all too often and would not load programs back from tape,  it took me several lab sessions spanning over months to find out why it was so unreliable and to develop remedies for that, all of which I have published here on applefritter. (I lay claim to the title "The man who fixed the Apple-1" ;-)

 

Now, how are the odds for a typical hobbyist who just learned to solder ? With no professional background ? When using an IC set containing a few bad ones ? And no oscilloscope ?

 

I think from my professional background I can state that the odds to get a working machine under these conditions are very slim. Those "Maverick" builders who did succeed under these conditions were incredibly lucky - like winning the lottery.

 

ABOUT THE KITS

 

What my kits did is to take the "lottery" risk away by providing a 100% tested and burned-in IC set, and hand selected timing components around the 74123 (which otherwise requires an oscilloscope to get on target). So, if the soldering was up to standards and no components were put in wrongly, build success was practically guaranteed.

 

It is really bad that my kits have been sold out for many years now, but this is how it is ... I just wanted to liquidate my Apple-1 IC stock to get my money back (you might know the story that these were bought for my wave-soldered Apple-1 project which was killed by the pandemic, but Armin of Munich picked up the ball I had to drop and you can still buy wave soldered, professionally manufactured Apple-1 clones from his company, with full functional warranty, and despite of his expensive prices this may be the best way for less experienced hobbyists to get a fully functional Apple-1 clone - you have to weigh in the risk factor if you try to build it yourself from unverified components, and it's always better to pay a premium price for a professionally made product having warranty than to lose close to US$1000 on components wasted on a botched DIY build which never works).

 

And it may be possible he also brings equivalents to "my" IC kits back, but if so, his kits will have a more professional packaging and will look nicer. The details are t.b.d. - but be aware Armin's kits, if they ever appear, will be much more expensive than the mine, which were sold at cost, and the prices for the critical ICs (2504, 2513, 2519, DS0025) have exploded since Y2019, when I  bought them.

 

So, there is hope that 100% tested IC kits for Apple-1 builders will come back. The 100% test means that no oscilloscope is needed ;-)

 

THE FUTILITY OF SIMPLE GO/NOGO TESTs

 

'natas666' also wrote:

 

" A passed test would basically only say the chip is generally working with a high likelyhood it will also work in circuit. "

 

Uncle Bernie comments:

 

This is a fallacy, at least for the Apple-1 case. It has been my experience that more than 50% of the "bad" ICs I fished out with my test and burn-in procedure were not really "dead" but had a large spectrum of weird behavior patterns which manifested themselves only after warm up, or under specific conditions ... this is why my 'diagnostics page' which came with my PROMs has this peculiar way to cycle through all the available characters in a "diagonal" pattern. Some 2504 would produce a bad character at a specific condition (which would then scroll up as the test progresses) and this may have been the "pattern sensitivity" these PMOS shift registers are notorious for.

 

You should keep in mind that ALL these ICs once did pass both the wafer sort test and the functional tests after packaging (back then, true parametric tests were typically only done on a sample basis). Commercial grade ICs were not tested over temperature (military spec ICs were).

 

So what are your odds with a simple tester that can't do parametric tests ?

 

It will be able to fish out ICs which died while sitting for 50 years in a warehouse or died from ESD while handling or never were the IC they claimed to be (Chinese counterfeits).

 

But if an IC passes this simple test (which I think is likely to be less sharp than the EOL functional test once done at their manufacturer) than what guarantee do you have that it will work in an Apple-1 ? With all the ringing signals and ringing power and ground rails ?

 

Also note that the Apple-1 runs some of the ICs close to their maximum rated clock frequency. Which makes them hot (well documented by thermal images here on applefritter in other threads). Will the tester you propose do the same ?

 

ON THE NEGATIVE VOLTAGE PULLDOWNS

 

'natas666' asked:

 

" @UncleBernie would not it be better to pull the outputs to GND ? that would prevent a negative voltage on the TTL device connected to the 2519. "

 

Uncle Bernie answers:

 

In general, you should always follow the datasheet of the IC in question and adopt the applications and test circuits shown there. If you deviate from these circuits recommended by the manufacturer of the IC, then all bets are off. The pulldowns to negative voltages may be necessary to make these ICs work at all (but I did not experiment with this - I prefer to follow the datasheets and application notes of the IC manufacturer, which, believe me, saves you from lots of grief and loss of time).

 

And in the case of the Apple-1, you should also test the IC in question with the same circuit it sees in the Apple-1 itself, which is the application for which you want to find out whether the IC works with it.

 

CONCLUSION

 

You can see, it's not a trivial exercise to design and implement all these tests. This again rises the question if it is worth doing. Where are the benefits ? Will the realized tests on that "backbit" tester really fish out enough bad (or limping) ICs to significantly increase the odds for Apple-1 build success ?

 

I have my doubts, and I gave you the reasons why. But you can prove me wrong ;-)

 

- Uncle Bernie

 

FOOTNOTE ABOUT THE USELESSNESS OF LOGIC ANALYZERS FOR APPLE-1 DEBUGGING

 

 I would not consider to take a logic analyzer to an Apple-1 debugging session. It's just too much work to hook it up and to program it, and alas, most logic analyzers are ill suited to diagnose issues with poor signal integrity like ringing etc. - they might detect such a problem to be present but to really find out exactly what is going on, you need to look with an oscilloscope anyways.

 

In general, it has been my experience that logic analyzers are the most hated and least used instruments in any industrial electronics lab. In 40 years of professional IC design work, I might have needed a logic analyzer maybe three or four times, to debug a new digital circuit. And I had a lab technician to do the tedious set up and programming work. It may take anywhere from 4 hours to 20 hours to set everything up to start a debug session, depending on the complexity of the task and the number of connections to be made (involving these notorious micro grabbers into which the wires from the test heads plug in). Also, these wires are too long for high clock speed work (but OK for the humble clock speeds in the Apple-1).

 

This is why I regard logic analyzers a fad of the 1980s and early 1990s, and why they went the way of the dinosaur, and why you can buy a nice one, barely used, built in the 1990s on Ebay for $100 or less ... but nobody buys, logic analyzers don't sell. You can't even give them away because no one wants to pay for the shipping !

 

- Uncle Bernie

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@UncleBernie thank you for

@UncleBernie thank you for you long an detailed answer.

 

I don't know if Evie will add that chips to her Tester Firmware.

My Idea was just to help some people struggeling.

The BackBit Chip Tester  Pro V2 is quite affordable with about $200, it promises a lot, see below.

It already covers the logic chips used, 4096 DRAM, 82S129 PROMs, the MC6820/6821 and even the 6502 CPU.

I am skeptical when I read it will test a 6502 I actually do not expect much more then a NOP test to check all adresslines and maybe some simple RAM/ROM emulation to do the same with the Databus but no in deep test that checks every command.

To test the 4096 RAMs you need the tri-voltage adapter is also named DIY 4116 DRAM Adapter ans is $20 extra.

I did not tested it myself so far, but I have seen quite some positive reviews on YouTube.

What looked very interesting to me was some in-circuit testing that was done with some cable adapters but that looked quite experimental.

Manly in Europe (especially in Germany) you can find an alternative the Retro Chip Tester Professional that you can build yourself https://8bit-museum.de/hardware-projekte-chip-tester-english/

It's less compact and has less special chips on the support list. The bare PCB is 30€, with presoldered ATMega it's below 50€, all parts are about 140€.

 

Description

Supports all of the following chips, and firmware upgradeable to support even more chips!

4000 Series (CMOS including CD4000, etc…)14-pin detection test / 16-pin detection test / 24-pin detection test4000 4001 4002 4006 4007 4008 4009 4010 4011 4012 4013 4014 4015 4016 4017 4018 4019 4020 4021 4022 4023 4024 4025 4026 4027 4028 4029 4030 4031 4033 4034 4035 4040 4041 4042 4043 4044 4046 4047 4048 4049 4050 4051 4052 4053 4054 4055 4056 4059 4060 4063 4066 4067 4068 4069 4070 4071 4072 4073 4075 4076 4077 4078 4081 4082 4085 4086 4089 4093 4094 4097 4098 4099 40098 40102 40103 40104 40105 40106 40107 40109 40110 40147 40160 40161 40162 40163 40174 40175 40181 40192 40193 40194 40257 4316 4351 4500 4502 4503 4504 4508 4510 4511 4512 4514 4515 4516 4517 4518 4519 4520 4521 4522 4526 4527 4528 4529 4532 4536 4538 4539 4541 4543 4547 4549 4553 4555 4556 4557 4558 4559 4572 4584 4585 4599 4724 4852

7400 TTL Series (including 74S, 74LS, 74HCT, etc… — note that 74F is not supported at this time)14-pin detection test / 16-pin detection test / 20-pin detection test / 24-pin detection test7400 7401 7402 7403 7404 7405 7406 7407 7408 7409 7410 7411 7412 7413 7414 7415 7416 7417 7418 7419 7420 7421 7422 7423 7424 7425 7426 7427 7428 7430 7432 7433 7437 7438 7440 7442 7445 7446 7447 7448 7449 7450 7451 7452 7453 7454 7455 7456 7457 7460 7461 7462 7464 7465 7470 74L71 7472 7473 7474 7475 7476 7477 7478 7480 7483 7485 7486 7489 7490 7492 7493 7495 7496 7497 74100 74106 74107 74109 74111 74112 74113 74114 74121 74122 74123 74124 74125 74126 74128 74132 74133 74136 74137 74138 74139 74140 74141 74143 74145 74147 74148 74150 74151 74153 74154 74155 74156 74157 74158 74159 74160 74161 74162 74163 74164 74165 74166 74169 74170 74173 74174 74175 74176 74177 74179 74180 74181 74182 74183 74184 74189 74190 74191 74192 74193 74194 74195 74196 74197 74198 74199 74221 74224 74237 74238 74240 74241 74243 74244 74245 74246 74247 74248 74249 74251 74253 74257 74258 74259 74260 74265 74266 74273 74276 74279 74280 74283 74290 74292 74293 74297 74298 74299 74323 74350 74354 74365 74366 74367 74368 74373 74374 74375 74377 74378 74379 74386 74390 74393 74395 74399 74423 74465 74471 74518 74520 74521 74533 74534 74537 74540 74541 74543 74563 74564 74573 74574 74576 74589 74590 74594 74595 74597 74604 74606 74607 74612 74620 74621 74623 74629 74631 74638 74639 74640 74641 74642 74643 74645 74646 74669 74670 74674 74682 74684 74688 74699 74746 74747 74760 74783 74794 74841 74867 74901 74902 74906 74912 74914 74917 74922 74923 74925 74926 74990 741000 742540 742541 742620 748154

74HC CMOS SeriesThese tests are the same as the 74LS TTL tests, except they operate at 3.3V utilizing low voltage CMOS

ATARICO10444 TIACO10745 6507CO11903 TIACO12294 POKEYCO12295 CTIACO12296 ANTICCO14377 6502BCO14795 PIACO14805 GTIACO14806 SALLYCO14887 ANTISCO14889 GTIACO21697 ANTICCO21698 ANTICCO24674 MARIACO25718 MARIACO61991 FREDDIE137304 LETA

INTEL8031 8032 8035 8039 8040 8048 8049 8050 8051 8052 8085 8086 8088 CPU8155 8156 RAM/IO8212 IO8216 8226 BUS8243 EXP8244 8245 DISPLAY8250 UART8251 USART8253 8254 TIMER8255 PPI8256 MUART8257 DMAC8259 PIC8271 8272 FDC8279 PKDI8282 8283 LATCH8284 CLOCK8286 8287 BUS8288 CTLR8344 8744 8748 8749 CPU

MOS / Commodore Semiconductor Group / Amiga5717 MOUSE5719 GARY5721 BUSTER6502 6503 6504 6507 6510 6512 CPU6520 6521 PIA6522 VIA6526 CIA6529 SPI6530 RRIOT6532 RIOT6545 CRTC6551 ACIA6560 6561 VIC6566 6567 6569 VIC-II6570 6571 AMIGA Keyboard6581 6582 SID7360 TED7501 CPU7701 CLOCK7707 7708 7709 7711 7712 7713 7714 LOGIC8360 TED8362 8373 (SUPER) DENISE8364 PAULA8500 8501 8502 CPU8520 8521 CIA8551 ACIA8562 8565 VIC-II8563 VDC8564 8566 8569 VIC-IIe8580 SID8701 CLOCK8721 PLA8722 MMU251641 PLA251828 1571 GATE324744 324745 PLA325572 1541 GATE906114 PLA

MOTOROLANote that some chips, such as 6802 and 6808 cannot be tested due to CMOS levels. This should be fixed in tester V3.MC1411 MC1413 NPNMC3242A RAM PLEXMC3446 BUSMC3486 RECVMC3487 DRIVERMC4044 PHASEMCM6670 MCM6674 ROMMC6800 MC6803 MC6805 MC6809 CPUMCM6810 RAMMC6820 MC6821 PIAMC6822 IIAMC6840 PTMMC6844 DMACMC6845 CRTCMC6847 VDGMC6850 ACIAMC6854 ADLCMC6860 MODEMMC6882A/BMC6883 SAMMC6887 BUFMC14068 LOGICMC34051 TRANSCEIVERMC34161 VOLTAGEMC68008 CPUMC68488 GPIAMC68681 DUARTMC68901 MFP

Op Amps / ComparatorsNote that Op Amps with an internal voltage offset cannot be tested.LM111 / LM211 / LM311LM118 / LM218 / LM318LM119 / LM219 / LM319LM139 / LM239 / LM339LM158 / LM258 / LM358LM193 / LM293 / LM393LM2901 LM2903 LM2904NJM4556

OTHERμA8T26A μA8T28μPD765 μPD7720 μPD22100555 556 558620-1/2/4X ISOL75176 75462 754948602 9602AM2610 AM2630 AM2631 AM2632 AM2633 AM2901 AM2902 AM2918 AM29821 AM5380AMSTRAD 40010APPLE MAC RTCAPPLE II (IOU IWM KR9600 MMU SWIM)AY8910 AY8912 AY8913CA3046 CA3081 CA3082 CA3086 CA3146COP402 MCUDP8303 DP8304 DP8307 DP8308DS75494EF9345 CRTCFAIRCHILD 4702HARRIS HD-0165HD6301 CPU + ROMHD6303 HD6309 CPULM3909M54532PMSM6242RICOH 2A03 2A07 2C02 2C07 (NES CPU/PPU)RICOH RP5C01SAA1099SAA5050SEGA MITEC2SIGNETICS 2650 8230 8252 8263 8267 8284 8288SN15831 SN15845 SN15848 SN15857 SN15858 SN76489 SN76496TD62783TMS4500 TMS9118 TMS9128 TMS9129 TMS9901 TMS9902 TMS9914 TMS9918 TMS9928 TMS9929 TMS9995 TMS32010ULN2001 ULN2003 ULN2046 ULN2081 ULN2082 ULN2086 ULN2803WDC (W65C02 W65C22 W65C816)WD1770 WD1772 WD1773 WD2793 WD2797 WD3393 WD3765YM2149 YM2203 YM3526 YM3812Zilog Z5380 Z80 Z8410 Z8420 Z8430 Z8440 Z8470 Z8530ZX81 2C158E 2C184E ULA

RAMNote that Dynamic RAM chips require the buffered DRAM adapter(or tri-voltage adapter in some cases) when used with the V2 tester.16-pin Static (2700 2701 2102 2112 2115 2125 82S25)16-pin Dynamic (4027* 4096* 4116* 4516 8118 3732 4532 4164 4264 41128 41256) *Requires tri-voltage adapter18-pin Static (2111 2114 2147 2148 4104)18-pin Dynamic (4416 4464 1000 1024)20-pin Static (2142 65262)20-pin Dynamic (44256 44400)22-pin Static (2101 5101 82S212 6550 5561 CY7C164)24-pin Static (6810 4118 2016 6116 CY7C171)24-pin Dynamic (4461)28-pin Static (82S09 82S19 6264 24129 62256 CY7C421)32-pin Static (24512 628128 64008)48-pin Static (CY7C130)

ROM16-pin (82S23 82S123 82S126 82S129 82S130 82S131)18-pin (82S136 82S137 MCM6670 MCM6674)20-pin (6309, 7648, 7649)24-pin (2316, 2716, 2332, 2532, 2732, 2364)28-pin (6540, 2564, 2764, X2764, 27128, 27256, 28256, 27512, 531000)32-pin (27100-0, 27100-1, 27200, 27040 27080)40-pin (271024 27400)42-pin (27800)PAL/GAL (16L8 16R4 16R6 16R8 16V8 20L8 20R4 20R6 20R8 20V8 22V10) *reads as ROMGI Speech ROM (16/24 pin)CartRip (C64, C128, Atari 2600, Atari 5200, Atari 7800, Atari 8-Bit, ColecoVision, Intellivision, Tomy Tutor, Vectrex, VIC 20) *with additional adapter

The Chip Tester features: (bold items are new for Pro version, red items are new for Pro V2):

 

  • Fully automated 5V power routing (no need for power jumpers);
  • Modular design allows for backlit LCD screen and ZIF socket to be replaced easily;
  • Automatically discharges chip after testing;
  • Powered by industry standard USB-C;
  • Tests 5V TTL and 3.3V LVCMOS digital logic in DIP socket chips up to 48 pins;
  • Normally closed socket makes stronger connection than ordinary ZIF sockets;
  • Clamped i/o pins protect against under and over-voltage conditions;
  • Short detection helps prevent your delicate chips from getting damaged;
  • Firmware upgradeable with tests added based on user requests & feedback;
  • Confirms working chips to help narrow down problems;
  • Capable of “ripping” ROM chips to Micro SD card (card not included);
  • Pays for itself when it helps you rescue a machine you’ve given up on.

Accessories included:

  • Power cable, USB-A to USB-C type (you must provide your own USB power supply; 2A or more recommended).

Optional accessories available for purchase:

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Some more insights into the reality of IC "testing" !

In post #5, 'natas666' wrote:

 

" The Chip Tester can already test all the other chips used in the Apple I. "

 

Uncle Bernie comments:

 

No, it can't. For the reasons see my post #4 above. See, the truth is that a complete "test" of an IC would involve parametric testing of all the parameters specified in the datasheet, over the specified temperature range. For this, the industry uses testers like the "EAGLE" made by Teradyne, see here:

 

https://en.wikipedia.org/wiki/Eagle_Test_Systems

 

... which the last company I worked for  had. This tester costs several million US$ and the design and development of the "load board" and the test program for a typical product we had would be budgeted at $50000, minimum. The company also has some LTX-77 production testers, which have much lower costs per hour, but these are relics from 40 years ago which were controlled by Data General "Nova" minicomputers born in Y1969, and when Data General stopped making them, our company had to replace these Novas with a PC slot card that emulated the Nova. This is called technical obsolescence ... and some clever companies made bank by providing these Nova substitutes. (I mention this because Woz self-learned digital design by attempting to re-design the Nova ... for me it's a similar story, as a young teenager I first tried to re-design the Texas Instruments  TMS1000 microprocessor using TTLs salvaged from old PCBs and diode matrixes as the ROMs, and only later I discovered the brilliant design of the Nova).

 

Now, compare this expenditure on real, professional IC testers to these hobby grade testers you mentioned. I don't want to belittle them ... they indeed are useful and for the cost of one hour on the "EAGLE" (includes the hourly in company rate of the test engineer who runs the machine) you can get one of these hobby grade testers. Fine. They are a tremendous value for the buck.

 

But they never can do parametric testing. And this is what you would need to declare ICs to be "fit" to work in an Apple-1.

 

Sorry that I might have shattered your illusions. But this is how the real world is. In the realm of semiconductors, nothing is cheap. Everything is ridicolously expensive. I have a whole pile of groundbreaking, superior analog IC designs which never were built because nobody would want to spend the money to develop them, including me !

 

To be a happy electronics hobbyist, you need to understand the true hi tech / hi cost / hi risk nature of the game ... to avoid engaging into ventures / projects you simply can't do as a hobbyist (or as a one man show, like me).

 

This is why I spent the time to write up all these facts you can find in the above thread. I wanted to show the reader the reality, take away the delusions, and also point to viable alternatives.

 

-  Uncle Bernie

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my tests ;)

I tested the ds0025 on the breadboard with a signal generator and a scope - thats very easy.

The 2513 charrom is easy to test in a chip tester pro.

I tested the 2519 with external -12V (-17V to the +5V) supply in my Topmax programmer. I wrote a test program that shifts a bit through all 40 steps. 

The input levels and speed will not be tested, but the main function of the chips!

 

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@unclebernie you shattered

@unclebernie you shattered nothing I'm fully aware that a pocket knife with lots of tools can not replace a fully fledged toolbox.

But as you said yourself such a Tester can be useful for an hobbyist and offer quite a lot for the money.

And yes as wrote earlier you can not test any chip as 100% good as only the logic function but not the electric parameters have been tested. Almost certainly the logic functions have not even been tested with half of the maximum load that is allowed per pin.

But the tester will quite reliable identify fully broken chips, chips with broken ports and in many cases Fake Chips.

None of the mentioned testers mentions if it can bring RAM chips to the timing limit and can report an estimated access time from the tests done.

I am absolutely with you that the Pro or Professional does not belong in the name of both testers.

As it implies features that these devices do not have, what makes people think that these testers offer a comprehensive test what they are not doing.

And chips tested good can easily fail under load conditions or even after warming up a while.

I am very happy you are spending your precious time to share your large amount of experience with us.

 

@vossi that sound interesting but looks like it works only with a quite old MS-DOS software and this specific programmer.

 

 

 

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@natas666The Pico dram tester

@natas666

The Pico dram tester from Eric Schlaepfer (tubetime) now tests 4027 at full speed.

But the best test of all these mentioned chips is in an Apple1 board ;)

Christian

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